Cryo-imaging gives deeper view of thick biological materials

Electron microscopy is an exceptional tool for peering deep into the structure of isolated molecules. But when it comes to ...
Business Wire

JEOL: Release of Schottky Field Emission Scanning Electron Microscope JSM-IT800(i)/(is) Versions

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
The Scientist

Deeper Insights into Material Properties with the In situ Lab for ZEISS Field Emission Scanning Electron Microscopes

Today, ZEISS is introducing its new integrated in situ workflow for ZEISS field emission scanning electron microscopes (FE-SEM). When researchers need to link material performance to microstructure, ...
Business Wire

JEOL: Release of Scanning Electron Microscopes JSM-IT710HR/JSM-IT210

-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...
Science Daily

Development of a high-energy-resolution, LaB6 nanowire-based field emission gun

Engineers have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an aberration-corrected transmission electron microscope (TEM). This combined unit is ...
unr.edu

Electron Microscopy and Microanalysis Facility

Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...